JIB-4700F Composite Beam Processing Observation Device
Achieved a guaranteed resolution of 1.6 nm at a low acceleration voltage of 1 kV.
The Japan Electronics Corporation JIB-4700F composite beam processing observation device meets the high resolution and precision needs for evaluation techniques such as morphological observation, elemental analysis, and crystallographic analysis. Combined with the "in-lens Schottky electron gun," it enables high-resolution observation and high-speed analysis. 〇 Features - High-resolution SEM observation - High-speed analysis - High-speed processing - Enhanced detection system - Three-dimensional observation and analysis *For more details, please download the PDF or feel free to contact us.
- Company：アズサイエンス 松本本社
- Price：More than 100million yen
